Carrera, R., Castillo, N., Arce, E., Vázquez, A.L., Moran-Pineda, M., Montoya, J.A., Del Ángel, P. and Castillo, S. 2008. Nanocrystals Analysis of TIO2 by X-Ray Rietveld Refinement and Transmission Electron Microscopy (TEM). Acta Microscopica. 17, 1 (Dec. 2008), 85-93.