Englert, G., de León, A., Tessele, F. and Locatelli, C. (2003) “Atomic Force Microscopy - Scanning Electron Microscopy: comparative evaluation on solid surfaces”, Acta Microscopica, 12(1), pp. 107-110. vailable at: https://acta-microscopica.org/acta/article/view/323 (ccessed: 24November2024).