Carrera, R., Castillo, N., Arce, E., Vázquez, A. L., Moran-Pineda, M., Montoya, J. A., Del Ángel, P. and Castillo, S. (2008) “Nanocrystals Analysis of TIO2 by X-Ray Rietveld Refinement and Transmission Electron Microscopy (TEM).”, Acta Microscopica, 17(1), pp. 85-93. vailable at: https://acta-microscopica.org/acta/article/view/410 (ccessed: 19May2024).