Carrera R, Castillo N, Arce E, Vázquez AL, Moran-Pineda M, Montoya JA, Del Ángel P, Castillo S. Nanocrystals Analysis of TIO2 by X-Ray Rietveld Refinement and Transmission Electron Microscopy (TEM). acta [nternet]. 1Dec.2008 [cited 19May2024];17(1):85-3. vailable from: https://acta-microscopica.org/acta/article/view/410