Abstract

The structural and chemical characterization of the substrate and thin film of the zirconia-ytria/alumina system for Solid Oxide Fuel Cells and their electrical conductivity behavior are presented in this work. As a result of sputtering-radio-frequency deposition onto a porous alumina substrate, very homogeneous thin films of zirconia-ytria were produced. These nano grained thin films did not show any fracture or hole and its atomic structure was identified as the zirconia monoclinic phase. The substrate showed two alumina phases: corundum and alpha-alumina. All the samples exhibited a good electrical conductivity with slight variations in the range of temperature from 573 to 1J73OK