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Affiliations
A. Ponce
Instituto de Física, Universidad Nacional Autónoma de México. México
M.E. Sánchez-Vergara
Coordinación de Ingeniería Mecatrónica. Escuela de Ingeniería, Universidad Anahuac del Norte. México
M.A. Ruiz-Farfán
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México.
A. Ortiz
Instituto de Investigaciones en Materiales, Universidad Nacional Autónoma de México.
D. Romeu
Instituto de Física, Universidad Nacional Autónoma de México. México.
How to Cite
Study of metallic-phthalocyanines by transmission electron microscopy and atomic force microscopy
Vol 14 No 1-2 (2005)
Published: Dec 1, 2005
Abstract
In the present work, powder and thin films of Metallic-Phthalocyanines (FePc, CoPc, and PbPc) have been characterized by transmission electron microscopy (TEM), X-ray diffraction (XRD), and atomic force microscopy (AFM). XRD and selected area electron diffraction (SAED) patterns were used to determine the crystalline structures of the phases in powder samples. The crystalline phases in the metallic-phthalocyanines correspond to β-monoclinic type. The samples have been obtained in powders by organic syntheses and subsequently, the powders have been deposited onto silicon (100) substrates by thermal evaporation in a vacuum chamber to obtain the thin films. The surface topography of the films has been characterized by AFM. Needle-like and granular features randomly oriented in the films are visible.