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Affiliations
R. Sinclair
Department of Materials Science and Engineering, Stanford University
R. Chin
Stanford Nanocharacterization Laboratory, Geballe Laboratory for Advanced Materials, Stanford University
A. L. Koh
Department of Materials, Imperial College London.
G. Solórzano
Departamento de Ciência dos Materiais e Metalurgia, Pontifícia Universidade Católica do Rio de Janeiro. Brazil
How to Cite
A REPORT: “No Titan, No Excuse” (T. J. KOO, 1 APRIL 2008) A Report of an International Workshop On Remote Electron Microscopy for In Situ Studies
Vol 18 No 1 (2009)
Published: May 1, 2009
Abstract
This paper summarizes the presentations and discussions that took place at an international workshop concerning remote-access electron microscopy. This capability is rapidly expanding owing to improvements in the power of personal computers and ever-increasing speed and bandwidth of internet connections. It is also becoming more important as the cost of state-of-the-art equipment soars. The opportunities in both research and in educational outreach are identified and discussed, and the need for the following meetings established. The importance of embracing established and emerging national scientific endeavors is also emphasized.