Structural Characterization of the Layered Compound Ag2SnSe3 from Scanning and Transmission Electron Microscopy and Synchrotron Powder Diffraction

Abstract

In this paper, a study of structural characterization of the ternary semiconductor Ag₂SnSe₃ is presented. The experimental work was performed using Scanning Electron Microscopy (SEM), Selected Area Electron Diffraction (SAED) patterns, High Resolution Electron Microscopy (HREM), Annular Dark field imaging (ADF), and powder synchrotron X-ray Diffraction techniques. It was found that the semiconductor compound Ag₂SnSe₃ crystallizes in the monoclinic space group P2/m with cell parameters a = 7.977 Å, b = 7.912 Å, c = 13.023 Å, β = 101.734°, V = 804.79 ų.