Abstract

In convergent-beam electron-diffraction patterns at a zone axis orientation, the bright- field disc is often crossed by a set of fine dark lines - the HOLZ lines. These lines are formed because the diffracted beams are divided into well-separated Laue zones. The lines are valuable for the determination of the local lattice parameter of the crystal in the small volume traversed by the electrón beam. This is a tutorial review that summarizes the usefulness and limitations of the method.